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 A Signal Integrity Engineer's Companion: Real-Time Test & Measurement, & Design Simulation
  

  A Signal Integrity Engineer's Companion: Real-Time Test & Measurement, & Design Simulation by David Ireland ; Geoff Lawday ; Peter Bush ; Greg Edlund

  • Published by: PRENTICE-HALL
  • Author: David Ireland ; Geoff Lawday ; Peter Bush ; Greg Edlund
  • Page Count: 460
  • Group: COMMS - GENERAL
  • ISBN: 0131860062 / 9780131860063
  • Published: Jul 2008

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Book Information and Description:

A Signal Integrity Engineer's Companion: Real-Time Test & Measurement, & Design Simulation
This is the industry's most comprehensive, authoritative, and practical guide to modern Signal Integrity (SI) test and measurement for high-speed digital designs. Three of the field's leading experts guide you through systematically detecting, observing, analyzing, and rectifying both modern logic signal defects and embedded system malfunctions. The authors cover the entire life cycle of embedded system design from specification and simulation onward, illuminating key techniques and concepts with easy-to-understand illustrations.

 

Writing for all electrical engineers, signal integrity engineers, and chip designers, the authors show how to use real-time test and measurement to address today's increasingly difficult interoperability and compliance requirements. They also present detailed, start-to-finish case studies that walk you through commonly encountered design challenges, including ensuring that interfaces consistently operate with positive timing margins without incurring excessive cost; calculating total jitter budgets; and managing complex tradeoffs

in high-speed serial interface design.

 

Coverage includes

    * Understanding the complex signal integrity issues that arise in today's high-speed designs

    * Learning how eye diagrams, automated compliance tests, and signal analysis measurements can help you identify and solve SI problems

    * Reviewing the electrical characteristics of today's most widely used CMOS IO circuits

    * Performing signal path analyses based on intuitive Time-Domain Reflectometry (TDR) techniques

    * Achieving more accurate real-time signal measurements and avoiding probe problems and artifacts

    * Utilizing digital oscilloscopes and logic analyzers to make accurate measurements in high-frequency environments

    * Simulating real-world signals that stress digital circuits and expose SI faults

    * Accurately measuring jitter and other RF parameters in wireless applications

CONTENTS:

Foreword xv

Preface xix

Acknowledgments xxviii

About the Authors xxx

1 Introduction: An Engineer's Companion 1

2 Chip-to-Chip Timing and Simulation 31

3 Signal Path Analysis as an Aid to Signal Integrity 87

4 DDR2 Case Study 117

5 Real-Time Measurements: Probing 159

6 Testing and Debugging: Oscilloscopes and Logic Analyzers 213

7 Replicating Real-World Signals with Signal Sources 255

8 Signal Analysis and Compliance 287

9 PCI Express Case Study 367

10 The Wireless Signal 399

Index 439

 

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